1IHO
CRYSTAL APO-STRUCTURE OF PANTOTHENATE SYNTHETASE FROM E. COLI
X-RAY DIFFRACTION
Crystallization
Crystalization Experiments | ||||
---|---|---|---|---|
ID | Method | pH | Temperature | Details |
1 | VAPOR DIFFUSION, HANGING DROP | 8 | 298 | PEG 4000 (4-6%), Tris buffer pH 8 (50 mM), VAPOR DIFFUSION, HANGING DROP, temperature 298K |
Crystal Properties | |
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Matthews coefficient | Solvent content |
2.97 | 58 |
Crystal Data
Unit Cell | |
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Length ( Å ) | Angle ( ˚ ) |
a = 66.031 | α = 90 |
b = 78.075 | β = 103.71 |
c = 77.126 | γ = 90 |
Symmetry | |
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Space Group | P 1 21 1 |
Diffraction
Diffraction Experiment | ||||||||||||||
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ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
1 | 1 | x-ray | 100 | CCD | BRANDEIS - B4 | Condensing Mirror Tunable Monochromator | 1999-05-30 | M | MAD | |||||
2 | 1 | x-ray | 100 | CCD | BRANDEIS - B4 | Condensing Mirror Tunable Monochromator | 1999-05-30 | M |
Radiation Source | |||||
---|---|---|---|---|---|
ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
1 | SYNCHROTRON | NSLS BEAMLINE X25 | 0.970,0.8850,0.9791 | NSLS | X25 |
2 | SYNCHROTRON | NSLS BEAMLINE X25 | 1.1 | NSLS | X25 |
Data Collection
Overall | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | R Sym I (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | |||||||
1,2 | 1.7 | 50 | 97.8 | 0.103 | 0.103 | 15.9 | 7 | 77294 | 81357 | 2 | 2.1 | 28 |
Highest Resolution Shell | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R Merge I (Observed) | R-Sym I (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | ||||||||||
1.7 | 1.76 | 78.5 | 0.6 | 0.6 | 2 | 3 | 6542 |
Refinement
Statistics | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Diffraction ID | Structure Solution Method | Cross Validation method | Starting model | Resolution (High) | Resolution (Low) | Cut-off Sigma (I) | Number Reflections (All) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (All) | R-Factor (Observed) | R-Work | R-Free | R-Free Selection Details | Mean Isotropic B | |||
X-RAY DIFFRACTION | MAD | FREE R | From experimental phases | 1.7 | 50 | -999 | 77295 | 81357 | 4062 | 92.4 | 0.211 | 0.211 | 0.2118 | 0.2536 | RANDOM 5% | 36.4 |
Temperature Factor Modeling | ||||||
---|---|---|---|---|---|---|
Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
Coordinate Error | ||
---|---|---|
Structure Solution Method | Refinement High Resolution | Refinement Low Resolution |
4420 | 4956 |
RMS Deviations | |
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Key | Refinement Restraint Deviation |
s_similar_adp_cmpnt | 0.07 |
s_non_zero_chiral_vol | 0.04 |
s_zero_chiral_vol | 0.03 |
s_angle_d | 0.024 |
s_from_restr_planes | 0.0227 |
s_anti_bump_dis_restr | 0.01 |
s_bond_d | 0.008 |
s_similar_dist | |
s_rigid_bond_adp_cmpnt | |
s_approx_iso_adps |
Non-Hydrogen Atoms Used in Refinement | |
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Non-Hydrogen Atoms | Number |
Protein Atoms | 4333 |
Nucleic Acid Atoms | |
Solvent Atoms | 614 |
Heterogen Atoms | 20 |
Software
Software | |
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Software Name | Purpose |
SHELXL-97 | refinement |
SHARP | phasing |
REFMAC | refinement |
ARP | model building |
BUSTER | refinement |
TNT | refinement |
SHELX | model building |
O | model building |
SnB | phasing |
MOSFLM | data reduction |
CCP4 | data scaling |
BUSTER | phasing |
TNT | phasing |
SHELX | phasing |