X-RAY DIFFRACTION

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
1VAPOR DIFFUSION, HANGING DROP7.629322% PEG 3350, 0.1M TrisCl pH 7.6, 0.2M NaF, VAPOR DIFFUSION, HANGING DROP, temperature 293K
2VAPOR DIFFUSION, HANGING DROP7.629318% PEG 3350, 0.1M TrisCl pH 7.6, 0.2M NaF, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 44.234α = 90
b = 55.964β = 90
c = 74.937γ = 90
Symmetry
Space GroupI 2 2 2

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray100CCDRIGAKU JUPITER 2102004-11-05MSINGLE WAVELENGTH
21x-ray100CCDADSC QUANTUM 42005-04-11MMAD
1,21
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1SYNCHROTRONSPRING-8 BEAMLINE BL26B11SPring-8BL26B1
2SYNCHROTRONPHOTON FACTORY BEAMLINE AR-NW12A0.97908, 0.97971, 0.98359Photon FactoryAR-NW12A

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
1,21.645099.8117111171118.69
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
1,21.641.799.7

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodResolution (High)Resolution (Low)Number Reflections (All)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (All)R-Factor (Observed)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
X-RAY DIFFRACTIONMR, MADTHROUGHOUT1.6425.46117111115655599.80.185950.185950.184550.21259RANDOM21.153
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
-0.02-0.390.41
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_1_deg6.698
r_scangle_it4.458
r_scbond_it2.79
r_mcangle_it1.833
r_angle_refined_deg1.587
r_mcbond_it1.022
r_nbd_refined0.222
r_symmetry_vdw_refined0.216
r_xyhbond_nbd_refined0.169
r_symmetry_hbond_refined0.133
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_1_deg6.698
r_scangle_it4.458
r_scbond_it2.79
r_mcangle_it1.833
r_angle_refined_deg1.587
r_mcbond_it1.022
r_nbd_refined0.222
r_symmetry_vdw_refined0.216
r_xyhbond_nbd_refined0.169
r_symmetry_hbond_refined0.133
r_chiral_restr0.118
r_bond_refined_d0.014
r_gen_planes_refined0.007
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms663
Nucleic Acid Atoms
Solvent Atoms129
Heterogen Atoms

Software

Software
Software NamePurpose
REFMACrefinement
HKL-2000data reduction
SCALEPACKdata scaling
SOLVEphasing
MOLREPphasing