X-RAY DIFFRACTION
Crystallization
Crystalization Experiments | ||||
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ID | Method | pH | Temperature | Details |
1 | 7 | 0.5 M NACL, 10 MM HEPES PH 7, 25 MM AMPPNP |
Crystal Properties | |
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Matthews coefficient | Solvent content |
3.21 | 61.4 |
Crystal Data
Unit Cell | |
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Length ( Å ) | Angle ( ˚ ) |
a = 101.44 | α = 90 |
b = 115.02 | β = 90 |
c = 166.78 | γ = 90 |
Symmetry | |
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Space Group | C 2 2 21 |
Diffraction
Diffraction Experiment | ||||||||||||||
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ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
1 | 1 | x-ray | 100 | PIXEL | DECTRIS PILATUS | 2014-05-06 | M | SINGLE WAVELENGTH |
Radiation Source | |||||
---|---|---|---|---|---|
ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
1 | SYNCHROTRON | DIAMOND BEAMLINE I03 | Diamond | I03 |
Data Collection
Overall | |||||||||||||||||||
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | ||||||||
1 | 1.93 | 76.08 | 99.6 | 0.08 | 12.8 | 6.5 | 72694 |
Highest Resolution Shell | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R Merge I (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | |||||||||||
1 | 1.93 | 1.98 | 96.7 | 0.79 | 2.1 | 6.3 |
Refinement
Statistics | |||||||||||||||||||
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Diffraction ID | Structure Solution Method | Cross Validation method | Starting model | Resolution (High) | Resolution (Low) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | R-Free Selection Details | Mean Isotropic B | ||||
X-RAY DIFFRACTION | SAD | THROUGHOUT | NONE | 1.93 | 76.08 | 68961 | 3690 | 99.61 | 0.19637 | 0.19399 | 0.19 | 0.2416 | 0.24 | RANDOM | 32.427 |
Temperature Factor Modeling | ||||||
---|---|---|---|---|---|---|
Anisotropic B[1][1] | Anisotropic B[2][2] | Anisotropic B[3][3] | ||||
0.08 | -1.62 | 1.54 |
RMS Deviations | |
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Key | Refinement Restraint Deviation |
r_dihedral_angle_2_deg | 33.022 |
r_dihedral_angle_4_deg | 16.522 |
r_dihedral_angle_3_deg | 14.688 |
r_scbond_it | 5.37 |
r_mcangle_it | 5.306 |
r_dihedral_angle_1_deg | 5.053 |
r_mcbond_it | 4.311 |
r_angle_refined_deg | 1.323 |
r_chiral_restr | 0.086 |
r_bond_refined_d | 0.009 |
Non-Hydrogen Atoms Used in Refinement | |
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Non-Hydrogen Atoms | Number |
Protein Atoms | 5306 |
Nucleic Acid Atoms | |
Solvent Atoms | 606 |
Heterogen Atoms | 76 |
Software
Software | |
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Software Name | Purpose |
xia2 | data reduction |
XDS | data reduction |
Aimless | data scaling |
SHELX | phasing |
ARP/wARP | phasing |
REFMAC | refinement |