X-RAY DIFFRACTION

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
1VAPOR DIFFUSION, SITTING DROP72931.1 M Sodium malonate, 0.1 M HEPES, 0.5% (v/v) Jaffamine ED-2001
Crystal Properties
Matthews coefficientSolvent content
3.0960.14

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 105.752α = 90
b = 105.752β = 90
c = 159.181γ = 90
Symmetry
Space GroupP 41 21 2

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray100PIXELDECTRIS PILATUS 6M2020-10-02MSINGLE WAVELENGTH
21x-ray100PIXELDECTRIS PILATUS 6M2021-02-03MMAD
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1SYNCHROTRONSSRL BEAMLINE BL9-20.97950SSRLBL9-2
2SYNCHROTRONSSRL BEAMLINE BL12-20.97923, 0.95369, 0.97965SSRLBL12-2

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Merge I (Observed)Rrim I (All)Rpim I (All)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
12.14099.70.4530.4550.0422.3115.752930
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)R Merge I (Observed)Rrim I (All)Rpim I (All)CC (Half)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
12.12.1499.86.2166.2610.7360.63770.1

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodResolution (High)Resolution (Low)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (Observed)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
X-RAY DIFFRACTIONMADTHROUGHOUT2.137.4848749252196.220.13590.13430.1659RANDOM35.095
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
-0.66-0.661.32
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg29.844
r_dihedral_angle_4_deg18.245
r_dihedral_angle_3_deg14.47
r_dihedral_angle_1_deg5.33
r_rigid_bond_restr1.948
r_angle_refined_deg1.303
r_angle_other_deg1.298
r_chiral_restr0.06
r_bond_refined_d0.006
r_gen_planes_refined0.005
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg29.844
r_dihedral_angle_4_deg18.245
r_dihedral_angle_3_deg14.47
r_dihedral_angle_1_deg5.33
r_rigid_bond_restr1.948
r_angle_refined_deg1.303
r_angle_other_deg1.298
r_chiral_restr0.06
r_bond_refined_d0.006
r_gen_planes_refined0.005
r_bond_other_d0.003
r_gen_planes_other0.001
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms5098
Nucleic Acid Atoms
Solvent Atoms290
Heterogen Atoms

Software

Software
Software NamePurpose
REFMACrefinement
XDSdata scaling
PDB_EXTRACTdata extraction
XDSdata reduction
PHENIXphasing