8TRG

Structure of full-length LexA bound to a RecA filament


ELECTRON MICROSCOPY

Starting Model(s)

Initial Refinement Model(s)
TypeSourceAccession CodeDetails
in silico modelAlphaFold 

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d12.762
f_angle_d0.655
f_chiral_restr0.045
f_plane_restr0.006
f_bond_d0.005
Sample
SOS Signal Complex consisting of RecA, ssDNA, and LexA
Sample Components
RecA* activated filament
LexA Dimer
Specimen Preparation
Sample Aggregation StateFILAMENT
Vitrification InstrumentFEI VITROBOT MARK IV
Cryogen NameETHANE
Sample Vitrification DetailsBlotting time of 7.0 s; 0.0 blot force
3D Reconstruction
Reconstruction MethodHELICAL
Number of Particles233920
Reported Resolution (Å)2.93
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypeHELICAL
Axial SymmetryC1
Axial Rise16.23
Angular Rotation59.2
Axial SymmetryC1
Axial Rise16.23
Angular Rotation59.2
Axial SymmetryC1
Axial Rise16.23
Angular Rotation59.2
Axial SymmetryC1
Axial Rise16.23
Angular Rotation59.2
Map-Model Fitting and Refinement
Id1
Refinement SpaceREAL
Refinement ProtocolRIGID BODY FIT
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeGATAN K3 (6k x 4k)
Electron Dose (electrons/Å**2)46.2
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)500
Maximum Defocus (nm)2000
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2.7
Imaging ModeBRIGHT FIELD
Specimen Holder ModelFEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification64000
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging DetailsPreliminary grid screening was done manually
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONcryoSPARC4.0.3
IMAGE ACQUISITIONEPU
CTF CORRECTIONcryoSPARC4.0.3
MODEL FITTINGUCSF ChimeraX1.3
MODEL REFINEMENTPHENIX1.20.1
MODEL REFINEMENTISOLDE1.4
CLASSIFICATIONcryoSPARC4.0.3
RECONSTRUCTIONcryoSPARC4.0.3
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTIONcryoSPARC automated Filament Tracer using filament diameter of 100A, 17A separation between segments. Minimum and maximum filament diameters of 90A, 150A respectively. Inspect Picks to filter particles with high curvature or sinuosity Local power > 567.940 Local power < 5711.103 Curvature (1/A) < 0.005970 Sinuosity < 1.393924 Low pass filtered particles near micrograph edge.