8TRG
Structure of full-length LexA bound to a RecA filament
ELECTRON MICROSCOPY
Refinement
RMS Deviations | |
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Key | Refinement Restraint Deviation |
f_dihedral_angle_d | 12.762 |
f_angle_d | 0.655 |
f_chiral_restr | 0.045 |
f_plane_restr | 0.006 |
f_bond_d | 0.005 |
Sample |
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SOS Signal Complex consisting of RecA, ssDNA, and LexA |
Sample Components |
RecA* activated filament |
LexA Dimer |
Specimen Preparation | |
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Sample Aggregation State | FILAMENT |
Vitrification Instrument | FEI VITROBOT MARK IV |
Cryogen Name | ETHANE |
Sample Vitrification Details | Blotting time of 7.0 s; 0.0 blot force |
3D Reconstruction | |
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Reconstruction Method | HELICAL |
Number of Particles | 233920 |
Reported Resolution (Å) | 2.93 |
Resolution Method | FSC 0.143 CUT-OFF |
Other Details | |
Refinement Type | |
Symmetry Type | HELICAL |
Axial Symmetry | C1 |
Axial Rise | 16.23 |
Angular Rotation | 59.2 |
Axial Symmetry | C1 |
Axial Rise | 16.23 |
Angular Rotation | 59.2 |
Axial Symmetry | C1 |
Axial Rise | 16.23 |
Angular Rotation | 59.2 |
Axial Symmetry | C1 |
Axial Rise | 16.23 |
Angular Rotation | 59.2 |
Map-Model Fitting and Refinement | |||||
---|---|---|---|---|---|
Id | 1 | ||||
Refinement Space | REAL | ||||
Refinement Protocol | RIGID BODY FIT | ||||
Refinement Target | |||||
Overall B Value | |||||
Fitting Procedure | |||||
Details |
Data Acquisition | |||||||||
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Detector Type | GATAN K3 (6k x 4k) | ||||||||
Electron Dose (electrons/Å**2) | 46.2 |
Imaging Experiment | 1 |
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Date of Experiment | |
Temperature (Kelvin) | |
Microscope Model | FEI TITAN KRIOS |
Minimum Defocus (nm) | 500 |
Maximum Defocus (nm) | 2000 |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | |
Nominal CS | 2.7 |
Imaging Mode | BRIGHT FIELD |
Specimen Holder Model | FEI TITAN KRIOS AUTOGRID HOLDER |
Nominal Magnification | 64000 |
Calibrated Magnification | |
Source | FIELD EMISSION GUN |
Acceleration Voltage (kV) | 300 |
Imaging Details | Preliminary grid screening was done manually |
EM Software | ||
---|---|---|
Task | Software Package | Version |
PARTICLE SELECTION | cryoSPARC | 4.0.3 |
IMAGE ACQUISITION | EPU | |
CTF CORRECTION | cryoSPARC | 4.0.3 |
MODEL FITTING | UCSF ChimeraX | 1.3 |
MODEL REFINEMENT | PHENIX | 1.20.1 |
MODEL REFINEMENT | ISOLDE | 1.4 |
CLASSIFICATION | cryoSPARC | 4.0.3 |
RECONSTRUCTION | cryoSPARC | 4.0.3 |
Image Processing | ||||
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CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
PHASE FLIPPING AND AMPLITUDE CORRECTION | cryoSPARC automated Filament Tracer using filament diameter of 100A, 17A separation between segments. Minimum and maximum filament diameters of 90A, 150A respectively. Inspect Picks to filter particles with high curvature or sinuosity Local power > 567.940 Local power < 5711.103 Curvature (1/A) < 0.005970 Sinuosity < 1.393924 Low pass filtered particles near micrograph edge. |